X-ray Computed Tomography (CT) is a non-destructive technique for visualizing interior features within solid objects, and for obtaining digital information on their 3-D geometries and properties.
Research focuses on the description, interpretation and measurement of components, features and fabrics in soils and sediments at a microscopic level. Our instrumentation, in combination with our fieldwork, provides ample opportunity for varied grant funded research and undergraduate student learning.
Instrument System Capabilities
Perkin Elmer PE 4343 flat panel detector with an active area of 43x43cm and 2860x2860 pixels with 16bit dynamic range
- Reflection Target: 3 micron focus
- Transmission Target: 1 micron focus