FEI Inspect F
High vacuum FEG source scanning electron microscope (SEM) with EDS and WDS analysis.
EBSD crystallographic texture analysis, grain orientation and mapping
Scanning Transmission Electron Microscopy (STEM) in high-vacuum with nanometre resolution
N/A
Costs
Price per hour : tbc
Price O/N :
Contact details
Facility : NanoVision
Campus : Nanovision Francis Bancroft Building
Address : Ground Floor, Francis Bancroft Building Queen Mary University of London Mile End Road London E1 4NS
Manager : Russell Bailey
Contact : 020 7882 8469 Or 020 7882 8469